Current suppression in a double-island single-electron transistor for detection of degenerate charge configurations of a floating double-dot

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dc.creatorBrenner, R.
dc.creatorGreentree, Andrew D.
dc.creatorHamilton, A. R.
dc.date2003-10-21
dc.date.accessioned2026-07-07T02:54:19Z
dc.date.available2026-07-07T02:54:19Z
dc.descriptionWe have investigated a double-island single-electron transistor (DISET) coupled to a floating metal double-dot (DD). Low-temperature transport measurements were used to map out the charge configurations of both the DISET and the DD. A suppression of the current through the DISET was observed whenever the charge configurations of the DISET and the DD were energetically co-degenerate. This effect was used to distinguish between degenerate and non-degenerate charge configurations of the double-dot. We also show that this detection scheme reduces the susceptibility of the DISET to interference from random charge noise.
dc.description3 pages, 3 figures, to appear in Appl. Phys. Lett
dc.identifierhttps://arxiv.org/abs/cond-mat/0310478
dc.identifierhttp://arxiv.org/abs/cond-mat/0310478
dc.identifierAppl. Phys. Lett. 83, 4640 (2003).
dc.identifierdoi:10.1063/1.1630382
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/22499
dc.subjectCondensed Matter
dc.titleCurrent suppression in a double-island single-electron transistor for detection of degenerate charge configurations of a floating double-dot
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