Lattice parameters from direct-space images at two tilts

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dc.creatorQin, W.
dc.creatorFraundorf, P.
dc.date2000-01-11
dc.date2001-10-29
dc.date.accessioned2026-07-07T02:36:31Z
dc.date.available2026-07-07T02:36:31Z
dc.descriptionLattices in three dimensions are oft studied from the ``reciprocal space'' perspective of diffraction. Today, the full lattice of a crystal can often be inferred from direct-space information about three sets of non-parallel lattice planes. Such data can come from electron-phase or Z contrast images taken at two tilts, provided that one image shows two non-parallel lattice periodicities, and the other shows a periodicity not coplanar with the first two. We outline here protocols for measuring the 3D parameters of cubic lattice types in this way. For randomly-oriented nanocrystals with cell side greater than twice the continuous transfer limit, orthogonal +/-15 deg and +/-10 deg tilt ranges might allow one to measure 3D parameters of all such lattice types in a specimen from only two well-chosen images. The strategy is illustrated by measuring the lattice parameters of a 10 nm WC_{1-x} crystal in a plasma-enhanced chemical-vapor deposited thin film.
dc.description14 pages, 7 figs, 3 tables, 25 refs, RevTeX4, notes http://www.umsl.edu/~fraundor/help/imagnxtl.htm
dc.identifierhttps://arxiv.org/abs/cond-mat/0001139
dc.identifierhttp://arxiv.org/abs/cond-mat/0001139
dc.identifierUltramicroscopy 94, 3-4 (2003) 245-262
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/15948
dc.subjectMaterials Science
dc.subjectMetric Geometry
dc.subjectInstrumentation and Detectors
dc.titleLattice parameters from direct-space images at two tilts
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