A Millikelvin Scanned Probe for Measurement of Nanostructures
| dc.creator | Brown, K. R. | |
| dc.creator | Sun, L. | |
| dc.creator | Kane, B. E. | |
| dc.date | 2003-11-10 | |
| dc.date.accessioned | 2026-07-07T02:54:41Z | |
| dc.date.available | 2026-07-07T02:54:41Z | |
| dc.description | We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it incorporates a low noise cryogenic amplifier to measure both the vibrations of the tuning fork and the electrical signals from the nanostructures. At millikelvin temperatures the imaging resolution is below 1 um in a 22 um x 22 um range, and a coarse motion provides translations of a few mm. This scanned probe is useful for high bandwidth measurement of many high impedance nanostructures on a single sample. We show data locating an SET within an array and measure its coulomb blockade with a sensitivity of 2.6 x 10^-5 e/Hz^1/2. | |
| dc.description | 5 pages, 5 figures, submitted to RSI | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0311224 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0311224 | |
| dc.identifier | Rev. Sci. Instrum. 75, 2029 (2004) | |
| dc.identifier | doi:10.1063/1.1753104 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/22655 | |
| dc.subject | Mesoscale and Nanoscale Physics | |
| dc.title | A Millikelvin Scanned Probe for Measurement of Nanostructures | |
| dc.type | text |