Possible manifestation of spin fluctuations in the temperature behavior of resistivity in Sm_{1.85}Ce_{0.15}CuO_4 thin films

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dc.creatorSergeenkov, S.
dc.creatorLanfredi, A. J. C.
dc.creatorAraujo-Moreira, F. M.
dc.date2007-05-11
dc.date.accessioned2026-07-07T08:26:16Z
dc.date.available2026-07-07T08:26:16Z
dc.descriptionA pronounced step-like (kink) behavior in the temperature dependence of resistivity $ρ(T)$ is observed in the optimally-doped $Sm_{1.85}Ce_{0.15}CuO_4$ thin films around $T_{sf}=87K$ and attributed to manifestation of strong spin fluctuations induced by $Sm^{3+}$ moments with the energy $\hbar ω_{sf}=k_BT_{sf}\simeq 7meV$. In addition to fluctuation induced contribution $ρ_{sf}(T)$ due to thermal broadening effects (of the width $ω_{sf}$), the experimental data are found to be well fitted accounting for residual (zero-temperature) $ρ_{res}$, electron-phonon $ρ_{e-ph}(T)=AT$ and electron-electron $ρ_{e-e}(T)=BT^2$ contributions. The best fits produced $ω_p=2.1meV$, $τ_0^{-1}=9.5\times 10^{-14}s^{-1}$, $λ=1.2$, and $E_F=0.2eV$ for estimates of the plasmon frequency, the impurity scattering rate, electron-phonon coupling constant, and the Fermi energy, respectively.
dc.description6 pages (REVTEX4), 2 EPS figures; accepted for publication in JETP Letters
dc.identifierhttps://arxiv.org/abs/0705.1638
dc.identifierhttp://arxiv.org/abs/0705.1638
dc.identifierJETP Letters 85, 592 (2007)
dc.identifierdoi:10.1134/S0021364007110148
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/136882
dc.subjectSuperconductivity
dc.titlePossible manifestation of spin fluctuations in the temperature behavior of resistivity in Sm_{1.85}Ce_{0.15}CuO_4 thin films
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