On the sensitivity of wave channeling of X-ray beam to the shape of interface channels

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dc.creatorBobrova, T. A.
dc.creatorOgnev, L. I.
dc.date2000-09-05
dc.date.accessioned2026-07-07T05:44:46Z
dc.date.available2026-07-07T05:44:46Z
dc.descriptionThe effect of transmission of x-ray beams through submicron capillaries was investigated with account for diffraction and roughness scattering. Possible explanation of anomalous energy dependence of transmission through thin Cr/C/Cr channeles was given due to effect of periodic deformations.
dc.description12 pages, 5 figures
dc.identifierhttps://arxiv.org/abs/physics/0009017
dc.identifierhttp://arxiv.org/abs/physics/0009017
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/83773
dc.subjectOptics
dc.titleOn the sensitivity of wave channeling of X-ray beam to the shape of interface channels
dc.typetext

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