Use of real-time Fourier Transform Infrared Reflectivity as an in situ monitor of YBCO film growth and processing

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dc.creatorKoster, Gertjan
dc.creatorHuh, Jeong-Uk
dc.creatorHammond, R. H.
dc.creatorBeasley, M. R.
dc.date2007-01-18
dc.date.accessioned2026-07-07T08:22:07Z
dc.date.available2026-07-07T08:22:07Z
dc.descriptionFourier Transform Infrared (FTIR) spectroscopy has been utilized during high rate E-beam evaporation/deposition of YBa2Cu3O7 (YBCO). The results demonstrate the great utility of FTIR as an in situ monitor of YBCO deposition and processing. We detect different (amorphous/fine polycrystalline) insulating pre-existing phases to the high Tc superconducting phase which appear to have distinct reflectivity fingerprints dominated by thin film interference effects, as a function of temperature and oxygen pressure. These fingerprints reveal some of the kinetic and thermodynamic pathways during the growth of YBCO.
dc.description13 pages, 3 figures The following article has been submitted to Applied Physics Letters. After it is published, it will be found at http://apl.aip.org
dc.identifierhttps://arxiv.org/abs/cond-mat/0701462
dc.identifierhttp://arxiv.org/abs/cond-mat/0701462
dc.identifierAppl. Phys. Lett. 90, 261917 (2007) (3 pages)
dc.identifierdoi:10.1063/1.2753118
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/135546
dc.subjectMaterials Science
dc.subjectSuperconductivity
dc.titleUse of real-time Fourier Transform Infrared Reflectivity as an in situ monitor of YBCO film growth and processing
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