New approach to analysis of negative magnetoresistance. The statistics of the closed paths

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dc.creatorMinkov, G. M.
dc.creatorNegashev, S. A.
dc.creatorRut, O. E.
dc.creatorGermanenko, A. V.
dc.creatorKhrykin, O. I.
dc.creatorShashkin, V. I.
dc.creatorDanil'tsev, V. M.
dc.date1999-04-23
dc.date1999-12-24
dc.date.accessioned2026-07-07T03:13:19Z
dc.date.available2026-07-07T03:13:19Z
dc.descriptionIt is shown that a new kind of information can be extracted from the Fourier transform of negative magnetoresistance (MR) in 2D semiconductor structures. The procedure proposed provides the information on the area distribution function of the closed paths and on the area dependence of the mean length of closed paths $\bar{L} (S)$ . Based on this line of attack the method of analysis of the negative MR is suggested. The method is used for data treatment of negative MR in 2D structures. In previous version (cond-mat/9902038) we suppoused that the difference in area dependence of $\bar{L} (S)$ for structures investigated came from the difference in scattering ansotropy. The more detailed analysis shows that main reason for such difference is different relations between momentum and phase relaxation times.
dc.descriptionThis paper has been significantly modified and placed in cond-mat/9912431
dc.identifierhttps://arxiv.org/abs/cond-mat/9904336
dc.identifierhttp://arxiv.org/abs/cond-mat/9904336
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/29252
dc.subjectCondensed Matter
dc.titleNew approach to analysis of negative magnetoresistance. The statistics of the closed paths
dc.typetext

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