Comments on "A model for fatigue in ferroelectric perovskite thin films" published in Appl. Phys. Lett, 76, 1060 (2000); addendum, ibid. p.3655

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dc.creatorTagantsev, Alexander K.
dc.date2002-11-28
dc.date.accessioned2026-07-07T02:48:26Z
dc.date.available2026-07-07T02:48:26Z
dc.descriptionThe paper comments on a paper by Dawber and Scott published in Appl. Phys. Lett, 76,1060 (2000) and addendum (ibid. p.3655), which addresses an important issue of the physics of ferroelectric thin films - the role of oxygen vacancies in polarization fatigue. It is shown that the content of this paper (starting equations, calculations, parameters used in calculations and the way the obtained results are compared to the experimental data available in the literature) enables questioning the results and conclusions reported in it.
dc.identifierhttps://arxiv.org/abs/cond-mat/0211660
dc.identifierhttp://arxiv.org/abs/cond-mat/0211660
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/20405
dc.subjectMaterials Science
dc.titleComments on "A model for fatigue in ferroelectric perovskite thin films" published in Appl. Phys. Lett, 76, 1060 (2000); addendum, ibid. p.3655
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