Nanoscale Observation of Alkane Delayering

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dc.creatorBai, M.
dc.creatorKnorr, K.
dc.creatorSimpson, M. J.
dc.creatorTrogisch, S.
dc.creatorTaub, H.
dc.creatorEhrlich, S. N.
dc.creatorMo, H.
dc.creatorVolkmann, U. G.
dc.creatorHansen, F. Y.
dc.date2006-11-18
dc.date.accessioned2026-07-07T07:31:23Z
dc.date.available2026-07-07T07:31:23Z
dc.descriptionNoncontact Atomic Force Microscopy and synchrotron x-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point Tb in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above Tb and to a solid 3D phase on cooling below Tb. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.
dc.description13 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0611497
dc.identifierhttp://arxiv.org/abs/cond-mat/0611497
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/118738
dc.subjectSoft Condensed Matter
dc.titleNanoscale Observation of Alkane Delayering
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