Probing pairing symmetry of Sm_{1.85}Ce_{0.15}CuO_4 via highly-sensitive voltage measurements: Evidence for strong impurity scattering

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dc.creatorLanfredi, A. J. C.
dc.creatorSergeenkov, S.
dc.creatorAraujo-Moreira, F. M.
dc.date2007-01-18
dc.date.accessioned2026-07-07T07:41:39Z
dc.date.available2026-07-07T07:41:39Z
dc.descriptionUsing a highly-sensitive home-made mutual-inductance technique, temperature profiles of the magnetic penetration depth $λ(T)$ in the optimally-doped $Sm_{1.85}Ce_{0.15}CuO_4$ thin films have been extracted. The low-temperature behavior of $λ(T)$ is found to be best-fitted by linear $Δλ(T)/λ(0)= \ln(2)k_BT/Δ_0$ and quadratic $Δλ(T)/λ(0)=Γ^{-1/2}Δ_0^{-3/2}T^2$ laws above and below $T=0.22T_C$, respectively, which clearly indicates the presence of d-wave pairing mechanism dominated by strong paramagnetic scattering at the lowest temperatures. The best fits produce $Δ_0/k_BT_C=2.07$ and $Γ/T_C=0.25(T_C/Δ_0)^3$ for the estimates of the nodal gap parameter and impurity scattering rate.
dc.identifierhttps://arxiv.org/abs/cond-mat/0701455
dc.identifierhttp://arxiv.org/abs/cond-mat/0701455
dc.identifierPhysics Letters A 359, 696 (2006)
dc.identifierdoi:10.1016/j.physleta.2006.07.010
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/122188
dc.subjectSuperconductivity
dc.subjectMaterials Science
dc.titleProbing pairing symmetry of Sm_{1.85}Ce_{0.15}CuO_4 via highly-sensitive voltage measurements: Evidence for strong impurity scattering
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