Microstructural and morphological properties of homoepitaxial (001)ZnTe layers investigated by x-ray diffuse scattering

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dc.creatorDi Luccio, T.
dc.creatorScalia, G.
dc.creatorTapfer, L.
dc.creatorMorales, P.
dc.creatorTraversa, M.
dc.creatorPrete, P.
dc.creatorLovergine, N.
dc.date2005-04-16
dc.date.accessioned2026-07-07T03:04:46Z
dc.date.available2026-07-07T03:04:46Z
dc.descriptionThe microstructural and morphological properties of homoepitaxial (001)ZnTe layers are investigated by x-ray diffuse scattering. High resolution reciprocal space maps recorded close to the ZnTe (004) Bragg peak show different diffuse scattering features. One kind of cross-shaped diffuse scattering streaks along <111> directions can be attributed to stacking faults within the epilayers. Another kind of cross-shaped streaks inclined at an angle of about 80deg with respect to the <110> in-plane direction arises from the morphology of the epilayers. (abridged version)
dc.identifierhttps://arxiv.org/abs/cond-mat/0504404
dc.identifierhttp://arxiv.org/abs/cond-mat/0504404
dc.identifierJ. Appl. Phys. 97, 083540 (2005)
dc.identifierdoi:10.1063/1.1870101
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/26210
dc.subjectMaterials Science
dc.titleMicrostructural and morphological properties of homoepitaxial (001)ZnTe layers investigated by x-ray diffuse scattering
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