Decay dynamics of neutral and charged excitonic complexes in single InAs/GaAs quantum dots

Simple item page
dc.creatorFeucker, M.
dc.creatorSeguin, R.
dc.creatorRodt, S.
dc.creatorHoffmann, A.
dc.creatorBimberg, D.
dc.date2008-02-07
dc.date.accessioned2026-07-07T09:21:07Z
dc.date.available2026-07-07T09:21:07Z
dc.descriptionSystematic time-resolved measurements on neutral and charged excitonic complexes (X, XX, X+, and XX+) of 26 different single InAs/GaAs quantum dots are reported. The ratios of the decay times are discussed in terms of the number of transition channels determined by the excitonic fine structure and a specific transition time for each channel. The measured ratio for the neutral complexes is 1.7 deviating from the theoretically predicted value of 2. A ratio of 1.5 for the positively charged exciton and biexciton decay time is predicted and exactly matched by the measured ratio indicating identical specific transition times for the transition channels involved.
dc.description4 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0802.1010
dc.identifierhttp://arxiv.org/abs/0802.1010
dc.identifierAppl. Phys. Lett. 92, 063116 (2008)
dc.identifierdoi:10.1063/1.2844886
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/154912
dc.subjectMaterials Science
dc.titleDecay dynamics of neutral and charged excitonic complexes in single InAs/GaAs quantum dots
dc.typetext

Files

Collections

arXiv