X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling

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dc.creatorOtt, H.
dc.creatorSchuessler-Langeheine, C.
dc.creatorSchierle, E.
dc.creatorGrigoriev, A. Yu.
dc.creatorLeiner, V.
dc.creatorZabel, H.
dc.creatorKaindl, G.
dc.creatorWeschke, E.
dc.date2005-09-28
dc.date.accessioned2026-07-07T06:19:35Z
dc.date.available2026-07-07T06:19:35Z
dc.descriptionQuantitative analyses of x-ray scattering from thin films of Ho and Dy metal at the M_5 resonances result in values of the optical constants and the magnetic scattering lengths f_m, with f_m as large as 200 r_0. The observation of first- and second-order magnetic satellites allows to separate f_m into circular and linear dichroic contributions. This high magnetic sensitivity, in conjunction with the tunable x-ray probing depth across the resonance can be applied to monitor depth profiles of complex magnetic structures, as e.g. of helical antiferromagnetic domains in a Dy metal film.
dc.description4 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0509725
dc.identifierhttp://arxiv.org/abs/cond-mat/0509725
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/95080
dc.subjectOther Condensed Matter
dc.titleX-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling
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