Oriented growth of pentacene films on vacuum-deposited polytetrafluoroethylene layers aligned by rubbing technique

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dc.creatorPrelipceanu, M.
dc.creatorPrelipceanu, O. S.
dc.creatorTudose, O. G.
dc.creatorGrytsenko, K.
dc.creatorSchrader, S.
dc.date2007-04-04
dc.date.accessioned2026-07-07T07:54:30Z
dc.date.available2026-07-07T07:54:30Z
dc.descriptionWe investigated structure and morphology of PTFE layers deposited by vacuum process in dependence on deposition parameters: deposition rate, deposition temperature, electron activation energy and activation current. Pentacene (PnC) layers deposited on top of those PTFE films are used as a tool to demonstrate the orienting ability of the PTFE layers. The molecular structure of the PTFE films was investigated by use of infrared spectroscopy. By means of ellipsometry, values of refractive index between 1.33 and 1.36 have been obtained for PTFE films in dependence on deposition conditions. Using the cold friction technique orienting PTFE layers with unidirectional grooves are obtained. On top of these PTFE films oriented PnC layers were grown. The obtained order depends both on the PTFE layer thickness and on PnC growth temperature.
dc.description13 pages, 9 figures, 1 table, conference
dc.identifierhttps://arxiv.org/abs/0704.0538
dc.identifierhttp://arxiv.org/abs/0704.0538
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/126634
dc.subjectMaterials Science
dc.subjectSoft Condensed Matter
dc.titleOriented growth of pentacene films on vacuum-deposited polytetrafluoroethylene layers aligned by rubbing technique
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