Near-Field Microwave Microscopy of Materials Properties

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dc.creatorAnlage, Steven M.
dc.creatorSteinhauer, D. E.
dc.creatorFeenstra, B. J.
dc.creatorVlahacos, C. P.
dc.creatorWellstood, F. C.
dc.date2000-01-07
dc.date2000-04-18
dc.date.accessioned2026-07-07T02:36:27Z
dc.date.available2026-07-07T02:36:27Z
dc.descriptionNear-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broad frequency range. In addition, the measurements can be done quantitatively so that images of microwave materials properties can be created. We review the five major types of near-field microwave microscopes and discuss our own form of microscopy in detail. Quantitative images of microwave sheet resistance, dielectric constant, and dielectric tunability are presented and discussed. Future prospects for near-field measurements of microwave electrodynamic properties are also presented.
dc.description31 pages, 9 figures, lecture given at the 1999 NATO ASI on Microwave Superconductivity Changes suggested by editor, including full references
dc.identifierhttps://arxiv.org/abs/cond-mat/0001075
dc.identifierhttp://arxiv.org/abs/cond-mat/0001075
dc.identifierMicrowave Superconductivity, edited by H. Weinstock and M. Nisenoff, (Kluwer, Amsterdam, 2001), pp. 239-269
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/15927
dc.subjectMaterials Science
dc.subjectSuperconductivity
dc.titleNear-Field Microwave Microscopy of Materials Properties
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