Extreme Value Statistics in Silicon Photonics

dc.creatorBorlaug, David
dc.creatorJalali, Bahram
dc.date2008-08-31
dc.date.accessioned2026-07-07T09:59:41Z
dc.date.available2026-07-07T09:59:41Z
dc.descriptionWe show that fluctuations of Raman amplified pulses, in the presence of a noisy pump, follow extreme value statistics, and provide mathematical insight into the origin of this perplexing behavior.
dc.identifierhttps://arxiv.org/abs/0809.0152
dc.identifierhttp://arxiv.org/abs/0809.0152
dc.identifierLEOS Invited Paper 2008
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/168114
dc.subjectOptics
dc.titleExtreme Value Statistics in Silicon Photonics
dc.typetext

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