Quantum Imaging and Metrology

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dc.creatorLee, Hwang
dc.creatorKok, Pieter
dc.creatorDowling, Jonathan P.
dc.date2003-06-17
dc.date.accessioned2026-07-07T06:07:08Z
dc.date.available2026-07-07T06:07:08Z
dc.descriptionThe manipulation of quantum entanglement has found enormous potential for improving performances of devices such as gyroscopes, clocks, and even computers. Similar improvements have been demonstrated for lithography and microscopy. We present an overview of some aspects of enhancement by quantum entanglement in imaging and metrology.
dc.description6 pages, 3 figures: Proceedings of the Sixth International Conference on Quantum Communication, Measurement and Computing, edited by J. H. Shapiro and O. Hirota (Rinton Press, 2002)
dc.identifierhttps://arxiv.org/abs/quant-ph/0306113
dc.identifierhttp://arxiv.org/abs/quant-ph/0306113
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/91185
dc.subjectQuantum Physics
dc.titleQuantum Imaging and Metrology
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