Gate voltage effects in capacitively coupled quantum dots

dc.creatorMitchell, Andrew K.
dc.creatorGalpin, Martin R.
dc.creatorLogan, David E.
dc.date2006-11-08
dc.date.accessioned2026-07-07T07:31:15Z
dc.date.available2026-07-07T07:31:15Z
dc.descriptionWe study a system of two symmetrical capacitively coupled quantum dots, each coupled to its own metallic lead, focusing on its evolution as a function of the gate voltage applied to each dot. Using the numerical renormalization group and poor man's scaling techniques, the low-energy Kondo scale of the model is shown to vary significantly with the gate voltage, being exponentially small when spin and pseudospin degrees of freedom dominate; but increasing to much larger values when the gate voltage is tuned close to the edges of the Coulomb blockade staircase where low-energy charge-fluctuations also enter, leading thereby to correlated electron physics on energy/temperature scales more accessible to experiment. This range of behaviour is also shown to be manifest strongly in single-particle dynamics and electron transport through each dot.
dc.description8 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0611219
dc.identifierhttp://arxiv.org/abs/cond-mat/0611219
dc.identifierEurophys. Lett., 76, 95 (2006)
dc.identifierdoi:10.1209/epl/i2006-10219-1
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/118685
dc.subjectStrongly Correlated Electrons
dc.subjectMesoscale and Nanoscale Physics
dc.titleGate voltage effects in capacitively coupled quantum dots
dc.typetext

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