The critical current of YBa2Cu3O7-d Low Angle Grain Boundaries

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dc.creatorDurrell, J. H.
dc.creatorHogg, M. J.
dc.creatorKahlmann, F.
dc.creatorBarber, Z. H.
dc.creatorBlamire, M. G.
dc.creatorEvetts, J. E.
dc.date2003-02-21
dc.date2003-05-14
dc.date.accessioned2026-07-07T02:49:44Z
dc.date.available2026-07-07T02:49:44Z
dc.descriptionTransport critical current measurements have been performed on 5 degree [001]-tilt thin film YBa2Cu3O7-delta single grain boundaries with magnetic field rotated in the plane of the film, phi. The variation of the critical current has been determined as a function of the angle between the magnetic field and the grain boundary plane. In applied fields above 1 T the critical current, j_c, is found to be strongly suppressed only when the magnetic field is within an angle phi_k of the grain boundary. Outside this angular range the behavior of the artificial grain boundary is dominated by the critical current of the grains. We show that the phi dependence of j_c in the suppressed region is well described by a flux cutting model.
dc.descriptionTo be published in PRL, new version with minor changes following referees reports
dc.identifierhttps://arxiv.org/abs/cond-mat/0302430
dc.identifierhttp://arxiv.org/abs/cond-mat/0302430
dc.identifierDurrell et al, Physical Review Letters, 90 (24): 247006 (2003)
dc.identifierdoi:10.1103/PhysRevLett.90.247006
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/20919
dc.subjectSuperconductivity
dc.titleThe critical current of YBa2Cu3O7-d Low Angle Grain Boundaries
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