Effects of dephasing on shot-noise in an electronic Mach-Zehnder interferometer

Simple item page
dc.creatorMarquardt, Florian
dc.creatorBruder, C.
dc.date2004-02-03
dc.date.accessioned2026-07-07T02:56:16Z
dc.date.available2026-07-07T02:56:16Z
dc.descriptionWe present a theoretical study of the influence of dephasing on shot noise in an electronic Mach-Zehnder interferometer. In contrast to phenomenological approaches, we employ a microscopic model where dephasing is induced by the fluctuations of a classical potential. This enables us to treat the influence of the environment's fluctuation spectrum on the shot noise. We compare against the results obtained from a simple classical model of incoherent transport, as well as those derived from the phenomenological dephasing terminal approach, arguing that the latter runs into a problem when applied to shot noise calculations for interferometer geometries. From our model, we find two different limiting regimes: If the fluctuations are slow as compared to the time-scales set by voltage and temperature, the usual partition noise expression T(1-T) is averaged over the fluctuating phase difference. For the case of ``fast'' fluctuations, it is replaced by a more complicated expression involving an average over transmission amplitudes. The full current noise also contains other contributions, and we provide a general formula, as well as explicit expressions and plots for specific examples.
dc.description18 pages, 8 figures. A brief version is contained in cond-mat/0306504
dc.identifierhttps://arxiv.org/abs/cond-mat/0402099
dc.identifierhttp://arxiv.org/abs/cond-mat/0402099
dc.identifierPhys. Rev. B 70, 125305 (2004)
dc.identifierdoi:10.1103/PhysRevB.70.125305
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/23255
dc.subjectMesoscale and Nanoscale Physics
dc.titleEffects of dephasing on shot-noise in an electronic Mach-Zehnder interferometer
dc.typetext

Files

Collections

arXiv