Intragrain electrical inhomogenities and compositional variation of static dielectric constant in LaMn_{1-x}Fe_xO_3

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dc.creatorKarmakar, A.
dc.creatorMajumdar, S.
dc.creatorPatnaik, S.
dc.creatorGiri, S.
dc.date2009-01-28
dc.date.accessioned2026-07-07T13:04:53Z
dc.date.available2026-07-07T13:04:53Z
dc.descriptionBulk dc resistivity and dielectric constant measurements with temperature and frequency have been performed in LaMn_{1-x}Fe_xO_3 (0 <= x <= 1.0) as a result of Fe substitution both for the as-synthesized and oxygen annealed samples. Temperature dependence of real part of dielectric constant at different frequencies show a frequency and temperature independent value (epsilon_s) at low temperature for x >= 0.15 where epsilon_0 rises with x reaching a maximum at x = 0.5 and then it decreases sharply at x = 0.70 showing a further increasing trend with the further increase in x. The sharp drop of epsilon_s at x = 0.70 is correlated with the structural change from rhombohedral to orthorhombic structure. A considerable increase of epsilon_s ~ 43% is observed for an increase of x from 0.15 to 0.50. Furthermore, epsilon_s is increased considerably (up to ~ 17% at x = 0.5) due to the oxygen annealing for x <= 0.50. The low temperature resistivities satisfying Variable Range Hopping model are found to be related with the increase of epsilon_s with x for x <= 0.50. The analysis of the complex impedance and modulus planes at low temperature indicates the electrical inhomogeneities in the grain interior of the compounds.
dc.identifierhttps://arxiv.org/abs/0901.4442
dc.identifierhttp://arxiv.org/abs/0901.4442
dc.identifierJ. Phys. D: Appl. Phys. 42 (2009) 092004
dc.identifierdoi:10.1088/0022-3727/42/9/092004
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/227322
dc.subjectStrongly Correlated Electrons
dc.titleIntragrain electrical inhomogenities and compositional variation of static dielectric constant in LaMn_{1-x}Fe_xO_3
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