Strong reduction of field-dependent microwave surface resistance in YBa$_{2}$Cu$_{3}$O$_{7-δ}$ with sub-micrometric BaZrO$_3$ inclusions

Simple item page
dc.creatorPompeo, N.
dc.creatorRogai, R.
dc.creatorSilva, E.
dc.creatorAugieri, A.
dc.creatorGalluzzi, V.
dc.creatorCelentano, G.
dc.date2007-10-09
dc.date.accessioned2026-07-07T08:39:23Z
dc.date.available2026-07-07T08:39:23Z
dc.descriptionWe observe a strong reduction of the field induced thin film surface resistance measured at high microwave frequency ($ν=$47.7 GHz) in YBa$_{2}$Cu$_{3}$O$_{7-δ}$ thin films grown on SrTiO$_3$ substrates, as a consequence of the introduction of sub-micrometric BaZrO$_3$ particles. The field increase of the surface resistance is smaller by a factor of $\sim$3 in the film with BaZrO$_3$ inclusions, while the zero-field properties are not much affected. Combining surface resistance and surface reactance data we conclude (a) that BaZrO$_3$ inclusions determine very deep and steep pinning wells and (b) that the pinning changes nature with respect to the pure film.
dc.descriptionRevTeX; 4 pages, 3 figures; submitted to Applied Physics Letters
dc.identifierhttps://arxiv.org/abs/0710.1754
dc.identifierhttp://arxiv.org/abs/0710.1754
dc.identifierApplied Physics Letters 91, 182507 (2007)
dc.identifierdoi:10.1063/1.2803856
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/141054
dc.subjectSuperconductivity
dc.subjectMaterials Science
dc.titleStrong reduction of field-dependent microwave surface resistance in YBa$_{2}$Cu$_{3}$O$_{7-δ}$ with sub-micrometric BaZrO$_3$ inclusions
dc.typetext

Files

Collections

arXiv