Single particle relaxation time versus transport scattering time in a 2D graphene layer

dc.creatorHwang, E. H.
dc.creatorSarma, S. Das
dc.date2008-01-30
dc.date.accessioned2026-07-07T09:37:56Z
dc.date.available2026-07-07T09:37:56Z
dc.descriptionWe theoretically calculate and compare the single-particle relaxation time ($τ_s$) defining quantum level broadening and the transport scattering time ($τ_t$) defining Drude conductivity in 2D graphene layers in the presence of screened charged impurities scattering and short-range defect scattering. We find that the ratio $τ_t/τ_s$ increases strongly with increasing $k_F z_i$ and $κ$ where $k_F$, $z_i$, and $κ$ are respectively the Fermi wave vector, the separation of the substrate charged impurities from the graphene layer, and the background lattice dielectric constant. A critical quantitative comparison of the $τ_t/τ_s$ results for graphene with the corresponding modulation-doped semiconductor structures is provided, showing significant differences between these two 2D carrier systems.
dc.description7 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0801.4736
dc.identifierhttp://arxiv.org/abs/0801.4736
dc.identifierPhys. Rev. B 77, 195412 (2008)
dc.identifierdoi:10.1103/PhysRevB.77.195412
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/160631
dc.subjectMesoscale and Nanoscale Physics
dc.subjectMaterials Science
dc.titleSingle particle relaxation time versus transport scattering time in a 2D graphene layer
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