Automatic physical phasing X-ray crystallography

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dc.creatorMorelhão, Sérgio L.
dc.creatorAvanci, Luis H.
dc.creatorKycia, Stefan
dc.date2004-09-19
dc.date.accessioned2026-07-07T03:00:54Z
dc.date.available2026-07-07T03:00:54Z
dc.descriptionPhase invariants are important pieces of information about the atomic structures of crystals. There are several mathematical methods in X-ray crystallography to estimate phase invariants. The multi-wave diffraction phenomenon offers a unique opportunity of physically measuring phase invariants. In this work, the underneath principals for developing an automatic procedure to extract accurate phase-invariant values are described. A general systematic procedure is demonstrated, in practice, by analyzing intensity data from a KDP crystal.
dc.descriptionPresented at the 4th Conference on Synchrotron Radiation in Materials Science, Grenoble, France, August 23-25, 2004
dc.identifierhttps://arxiv.org/abs/cond-mat/0409487
dc.identifierhttp://arxiv.org/abs/cond-mat/0409487
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/24900
dc.subjectMaterials Science
dc.titleAutomatic physical phasing X-ray crystallography
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