Electron diffraction analysis of individual single-walled carbon nanotubes

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dc.creatorMeyer, Jannik C.
dc.creatorPaillet, Matthieu
dc.creatorDuesberg, Georg S.
dc.creatorRoth, Siegmar
dc.date2005-06-15
dc.date2005-08-14
dc.date.accessioned2026-07-07T06:24:34Z
dc.date.available2026-07-07T06:24:34Z
dc.descriptionWe present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects.
dc.description10 pages, 10 figures. Ultramicroscopy (in press), 2005
dc.identifierhttps://arxiv.org/abs/cond-mat/0506356
dc.identifierhttp://arxiv.org/abs/cond-mat/0506356
dc.identifierUltramicroscopy vol. 106 no. 3, pp. 176-190 (2006)
dc.identifierdoi:10.1016/j.ultramic.2005.07.008
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/96589
dc.subjectMaterials Science
dc.titleElectron diffraction analysis of individual single-walled carbon nanotubes
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