Temperature dependence of the resistance of a phase-slip line in a thin superconducting film

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dc.creatorIl'ichev, E. V.
dc.creatorKuznetsov, V. I.
dc.creatorTulin, V. A.
dc.date2004-06-24
dc.date2004-07-17
dc.date.accessioned2026-07-07T02:58:49Z
dc.date.available2026-07-07T02:58:49Z
dc.descriptionAn experimental investigation was made of the temperature dependence of the first step of a phase-slip line in a thin superconducting tin film. The depth of penetration of a nonequilibrium longitudinal electric field into the superconductor was determined near the critical temperature. A comparison was made with theoretical investigations of one-dimensional structures containing phase-slip centers. The experimental results were found to be in good agreement with the theory when the mechanism of mixing of electron-like and hole-like branches of the quasiparticle spectrum was governed by the elastic scattering of the excitations. This was one more experimental confirmation that a phase-slip line is a two-dimensional analog of a phase-slip center.
dc.description3 pages, 2 figures, Revtex4. Numeric format(separators)in Figures changed
dc.identifierhttps://arxiv.org/abs/cond-mat/0406581
dc.identifierhttp://arxiv.org/abs/cond-mat/0406581
dc.identifierPhys. Solid State 35(11), 1460 (1993). [Fiz. Tverd. Tela (St. Petersburg) 35, 2972 (1993)]
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/24261
dc.subjectSuperconductivity
dc.subjectMesoscale and Nanoscale Physics
dc.titleTemperature dependence of the resistance of a phase-slip line in a thin superconducting film
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