X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal

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dc.creatorCheynis, Fabien
dc.creatorRougemaille, Nicolas
dc.creatorBelkhou, Rachid
dc.creatorToussaint, Jean-Christophe
dc.creatorFruchart, Olivier
dc.date2008-02-06
dc.date.accessioned2026-07-07T09:19:06Z
dc.date.available2026-07-07T09:19:06Z
dc.descriptionX-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on Néel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of Néel-cap magnetization give clear evidence for the magnetization reversal of the Néel caps around 120 mT, with a $\pm$20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.
dc.identifierhttps://arxiv.org/abs/0802.0867
dc.identifierhttp://arxiv.org/abs/0802.0867
dc.identifierJournal of Applied Physics 103 (2008) 07D915
dc.identifierdoi:10.1063/1.2832332
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/154265
dc.subjectMaterials Science
dc.titleX-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal
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