Dynamical pattern formation upon dewetting

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dc.creatorBecker, Jürgen
dc.creatorGrün, Günther
dc.creatorSeemann, Ralf
dc.creatorJacobs, Karin
dc.date2001-06-16
dc.date.accessioned2026-07-07T02:41:48Z
dc.date.available2026-07-07T02:41:48Z
dc.descriptionDewetting of thin liquid films is monitored in situ by atomic force microscopy, results are compared with simulations. The experimental setting is mimicked as close as possible using the experimental parameters including the effective interface potential. Numerics for the thin film equation are based on recently developed schemes which are up to now the only methods convergent in all relevant space dimensions. Temporal evolution and morphology of experiment and simulation are compared quantitatively. Our results explain the origin of complex generic patterns that evolve upon dewetting.
dc.description4 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0106313
dc.identifierhttp://arxiv.org/abs/cond-mat/0106313
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/17888
dc.subjectSoft Condensed Matter
dc.titleDynamical pattern formation upon dewetting
dc.typetext

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