External field control of donor electron exchange at the Si/SiO2 interface
| dc.creator | Calderon, M. J. | |
| dc.creator | Koiller, Belita | |
| dc.creator | Sarma, S. Das | |
| dc.date | 2006-12-04 | |
| dc.date | 2007-03-19 | |
| dc.date.accessioned | 2026-07-07T07:52:16Z | |
| dc.date.available | 2026-07-07T07:52:16Z | |
| dc.description | We analyze several important issues for the single- and two-qubit operations in Si quantum computer architectures involving P donors close to a SiO2 interface. For a single donor, we investigate the donor-bound electron manipulation (i.e. 1-qubit operation) between the donor and the interface by electric and magnetic fields. We establish conditions to keep a donor-bound state at the interface in the absence of local surface gates, and estimate the maximum planar density of donors allowed to avoid the formation of a 2-dimensional electron gas at the interface. We also calculate the times involved in single electron shuttling between the donor and the interface. For a donor pair, we find that under certain conditions the exchange coupling (i.e. 2-qubit operation) between the respective electron pair at the interface may be of the same order of magnitude as the coupling in GaAs-based two-electron double quantum dots where coherent spin manipulation and control has been recently demonstrated (for example for donors ~10 nm below the interface and \~40 nm apart, J~10^{-4} meV), opening the perspective for similar experiments to be performed in Si. | |
| dc.description | 11 pages, 15 figures. Changes in Eq. 24 plus minor typos | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0612093 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0612093 | |
| dc.identifier | Phys. Rev. B 75, 125311 (2007) | |
| dc.identifier | doi:10.1103/PhysRevB.75.125311 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/125818 | |
| dc.subject | Mesoscale and Nanoscale Physics | |
| dc.subject | Quantum Physics | |
| dc.title | External field control of donor electron exchange at the Si/SiO2 interface | |
| dc.type | text |