Intermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling

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dc.creatorSüle, P.
dc.creatorMenyhard, M.
dc.date2006-05-05
dc.date.accessioned2026-07-07T07:08:46Z
dc.date.available2026-07-07T07:08:46Z
dc.descriptionThe ion-bombardment induced evolution of intermixing is studied by molecular dynamics simulations and by Auger electron spectroscopy depth profiling analysis (AESD) in Cu/Co multilayer. It has been shown that from AESD we can derive the low-energy mixing rate and which can be compared with the simulated values obtained by molecular dynamics (MD) simulations. The overall agreement is reasonably good hence MD can hopefuly be used to estimate the rate of intermixing in various interface systems.
dc.description3 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0605130
dc.identifierhttp://arxiv.org/abs/cond-mat/0605130
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/110828
dc.subjectMaterials Science
dc.titleIntermixing in Cu/Co: molecular dynamics simulations and Auger electron spectroscopy depth profiling
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