Rayleigh scattering, mode coupling, and optical loss in silicon microdisks

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dc.creatorBorselli, Matthew
dc.creatorSrinivasan, Kartik
dc.creatorBarclay, Paul E.
dc.creatorPainter, Oskar
dc.date2004-06-22
dc.date2004-06-24
dc.date.accessioned2026-07-07T05:52:07Z
dc.date.available2026-07-07T05:52:07Z
dc.descriptionHigh refractive index contrast optical microdisk resonators fabricated from silicon-on-insulator wafers are studied using an external silica fiber taper waveguide as a wafer-scale optical probe. Measurements performed in the 1500 nm wavelength band show that these silicon microdisks can support whispering-gallery modes with quality factors as high as 5.2 x 10^5, limited by Rayleigh scattering from fabrication induced surface roughness. Microdisks with radii as small as 2.5 microns are studied, with measured quality factors as high as 4.7 x 10^5 for an optical mode volume of 5.3 cubic wavelengths in the material.
dc.description4 pages, 2 figures; contains minor correction to doublet splitting theory
dc.identifierhttps://arxiv.org/abs/physics/0406101
dc.identifierhttp://arxiv.org/abs/physics/0406101
dc.identifierApp. Phys. Lett., v85(17), pp. 3693-3695, Oct. 25, 2004
dc.identifierdoi:10.1063/1.1811378
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/86217
dc.subjectOptics
dc.titleRayleigh scattering, mode coupling, and optical loss in silicon microdisks
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