Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique
| dc.creator | Mukherjee, P. | |
| dc.creator | Sarkar, A. | |
| dc.creator | Barat, P. | |
| dc.creator | Jayakumar, T. | |
| dc.creator | Mahadevan, S. | |
| dc.creator | Rai, Sanjay K. | |
| dc.date | 2006-04-08 | |
| dc.date.accessioned | 2026-07-07T07:05:23Z | |
| dc.date.available | 2026-07-07T07:05:23Z | |
| dc.description | Determination of lattice misfit and microstructural parameters of the coherent precipitates in Ni based alloy Inconel-625 is a challenging problem as their peaks are completely overlapping among themselves and also with the matrix. We have used a novel X-ray diffraction technique on the bulk samples of Inconel 625 at different heat-treated conditions to determine the lattice parameters, the lattice misfit of the coherent precipitates with the matrix and their microstructural parameters like size and strain. | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0604222 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0604222 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/109649 | |
| dc.subject | Materials Science | |
| dc.title | Lattice Misfit Measurement in Inconel 625 by X-Ray Diffraction Technique | |
| dc.type | text |