Parametric Yield Analysis of Mems via Statistical Methods

Simple item page
dc.creatorVudathu, S. -P.
dc.creatorDuganapalli, K. -K.
dc.creatorLaur, Rainer
dc.creatorKubalinska, D.
dc.creatorBunse-Gerstner, A.
dc.date2007-11-21
dc.date.accessioned2026-07-07T08:45:36Z
dc.date.available2026-07-07T08:45:36Z
dc.descriptionThis paper considers a developing theory on the effects of inevitable process variations during the fabrication of MEMS and other microsystems. The effects on the performance and design yield of the microsystems devices are analyzed and presented. A novel methodology in the design cycle of MEMS and other microsystems is briefly introduced. This paper describes the initial steps of this methodology that is aimed at counteracting the parametric variations in the product cycle of microsystems. It is based on a concept of worst-case analysis that has proven successful in the parent IC technology. Issues ranging from the level of abstraction of the microsystem models to the availability of such models are addressed
dc.descriptionSubmitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)
dc.identifierhttps://arxiv.org/abs/0711.3287
dc.identifierhttp://arxiv.org/abs/0711.3287
dc.identifierDans Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2006, Stresa, Lago Maggiore : Italie (2006)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/143011
dc.subjectOther Computer Science
dc.titleParametric Yield Analysis of Mems via Statistical Methods
dc.typetext

Files

Collections

arXiv