Scintillation light produced by low-energy beams of highly-charged ions

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dc.creatorVogel, M.
dc.creatorWinters, D. F. A.
dc.creatorErnst, H.
dc.creatorZimmermann, H.
dc.creatorKester, O.
dc.date2007-10-25
dc.date.accessioned2026-07-07T11:38:21Z
dc.date.available2026-07-07T11:38:21Z
dc.descriptionMeasurements have been performed of scintillation light intensities emitted from various inorganic scintillators irradiated with low-energy beams of highly-charged ions from an electron beam ion source (EBIS) and an electron cyclotron resonance ion source (ECRIS). Beams of xenon ions Xe$^{q+}$ with various charge states between $q$=2 and $q$=18 have been used at energies between 5 keV and 17.5 keV per charge generated by the ECRIS. The intensity of the beam was typically varied between 1 and 100 nA. Beams of highly charged residual gas ions have been produced by the EBIS at 4.5 keV per charge and with low intensities down to 100 pA. The scintillator materials used are flat screens of P46 YAG and P43 phosphor. In all cases, scintillation light emitted from the screen surface was detected by a CCD camera. The scintillation light intensity has been found to depend linearly on the kinetic ion energy per time deposited into the scintillator, while up to $q$=18 no significant contribution from the ions' potential energy was found. We discuss the results on the background of a possible use as beam diagnostics e.g. for the new HITRAP facility at GSI, Germany.
dc.description6 pages, 8 figures
dc.identifierhttps://arxiv.org/abs/0710.4857
dc.identifierhttp://arxiv.org/abs/0710.4857
dc.identifierNucl.Instrum.Meth.B263:518-522,2007
dc.identifierdoi:10.1016/j.nimb.2007.06.021
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/199529
dc.subjectAtomic Physics
dc.subjectInstrumentation and Detectors
dc.titleScintillation light produced by low-energy beams of highly-charged ions
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