Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν
| dc.creator | Szalma, Ferenc | |
| dc.creator | Igloi, Ferenc | |
| dc.date | 1999-01-05 | |
| dc.date.accessioned | 2026-07-07T03:12:34Z | |
| dc.date.available | 2026-07-07T03:12:34Z | |
| dc.description | We consider two-dimensional Ising models with randomly distributed ferromagnetic bonds and study the local critical behavior at defect lines by extensive Monte Carlo simulations. Both for ladder and chain type defects, non-universal critical behavior is observed: the critical exponent of the defect magnetization is found to be a continuous function of the strength of the defect coupling. Analyzing corresponding stability conditions, we obtain new evidence that the critical exponent $ν$ of the bulk correlation length of the random Ising model does not depend on dilution, i.e. $ν=1$. | |
| dc.description | 4 pages in RevTeX, 4 eps figures included, submitted to J. Stat. Phys | |
| dc.identifier | https://arxiv.org/abs/cond-mat/9901026 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/9901026 | |
| dc.identifier | J. Stat. Phys., 95 (1999) 763 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/28951 | |
| dc.subject | Statistical Mechanics | |
| dc.subject | Disordered Systems and Neural Networks | |
| dc.title | Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν | |
| dc.type | text |