Absence of magic fillings of carrier-doped C$_{60}$ in a field-effect transistor

dc.creatorYunoki, Seiji
dc.creatorSawatzky, George A.
dc.date2001-10-29
dc.date.accessioned2026-07-07T02:43:18Z
dc.date.available2026-07-07T02:43:18Z
dc.descriptionMotivated by recent experiments of carrier-doped C$_{60}$ in a field-effect transistor (FET), effects of spatial single particle potential variations on Mott-Hubbard (MH) insulators are studied theoretically. It is shown that the presence of strong random potentials leads to a reduced dependence of electronic properties on band fillings and to disappearance of the MH insulating behavior at integer fillings. A simple physical picture to explain this behavior is given using a notion of self-doping of the MH insulator. Our results have important implications on some of the puzzling observations of carrier-doped C$_{60}$ in the FET. It is also discussed that the FET configuration with Al{$_2$}O{$_3$} dielectric provides an ``ideal'' system with strong disorders.
dc.description4 pages, RevTeX version 4, with 3 figures included
dc.identifierhttps://arxiv.org/abs/cond-mat/0110602
dc.identifierhttp://arxiv.org/abs/cond-mat/0110602
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/18450
dc.subjectStrongly Correlated Electrons
dc.subjectDisordered Systems and Neural Networks
dc.titleAbsence of magic fillings of carrier-doped C$_{60}$ in a field-effect transistor
dc.typetext

Files

Collections