A simple method for monitoring uniformity of epitaxial semiconductor structures

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dc.creatorKozlov, G. G.
dc.date2006-08-23
dc.date.accessioned2026-07-07T07:19:46Z
dc.date.available2026-07-07T07:19:46Z
dc.descriptionA simple method for visualization of nonuniformity of planar MBE structures is proposed. The method is based on measuring the relief of the photo-EMF. The method can be applied to a wide variety of semiconductor structures and does not require any expensive equipment.
dc.description2 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0608503
dc.identifierhttp://arxiv.org/abs/cond-mat/0608503
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/114751
dc.subjectMaterials Science
dc.titleA simple method for monitoring uniformity of epitaxial semiconductor structures
dc.typetext

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