A New Type 'Magnetic-field' Probe of High Spatial-resolution Based on a Single-layer Flat-coil Method

dc.creatorGevorgyan, S. G.
dc.creatorAzaryan, M. G.
dc.date2005-03-28
dc.date2005-04-01
dc.date.accessioned2026-07-07T03:04:19Z
dc.date.available2026-07-07T03:04:19Z
dc.descriptionA radically new approach to surface probing based on a replacement of the solid-state near-field probes by the 'long-field' ones is presented and discussed. Such probes may enable to create a radically new generation microscopes with non-perturbing long-range action probe based on a highly sensitive RF test method with a single-layer flat coil. This may give a start for creation of a new direction in microscopy.
dc.description4 pages, 2 figures. Journal of Contemporary Physics (Armenian Academy of Sciences), 2005, submitted [to be published by Allerton Press, Inc.]
dc.identifierhttps://arxiv.org/abs/cond-mat/0503646
dc.identifierhttp://arxiv.org/abs/cond-mat/0503646
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/26092
dc.subjectOther Condensed Matter
dc.titleA New Type 'Magnetic-field' Probe of High Spatial-resolution Based on a Single-layer Flat-coil Method
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