Experimental Measurement of Multi-dimensional Entanglement via Equivalent Symmetric Projection

Simple item page
dc.creatorSun, F. W.
dc.creatorCai, J. M.
dc.creatorXu, J. S.
dc.creatorChen, G.
dc.creatorLiu, B. H.
dc.creatorLi, C. F.
dc.creatorZhou, Z. W.
dc.creatorGuo, G. C.
dc.date2007-06-07
dc.date2007-11-20
dc.date.accessioned2026-07-07T08:43:32Z
dc.date.available2026-07-07T08:43:32Z
dc.descriptionWe construct a linear optics measurement process to determine the entanglement measure, named \emph{I-concurrence}, of a set of $4 \times 4$ dimensional two-photon entangled pure states produced in the optical parametric down conversion process. In our experiment, an \emph{equivalent} symmetric projection for the two-fold copy of single subsystem (presented by L. Aolita and F. Mintert, Phys. Rev. Lett. \textbf{97}, 050501 (2006)) can be realized by observing the one-side two-photon coincidence without any triggering detection on the other subsystem. Here, for the first time, we realize the measurement for entanglement contained in bi-photon pure states by taking advantage of the indistinguishability and the bunching effect of photons. Our method can determine the \emph{I-concurrence} of generic high dimensional bipartite pure states produced in parametric down conversion process.
dc.description4 figures
dc.identifierhttps://arxiv.org/abs/0706.0935
dc.identifierhttp://arxiv.org/abs/0706.0935
dc.identifierPHYSICAL REVIEW A 76, 052303 (2007)
dc.identifierdoi:10.1103/PhysRevA.76.052303
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/142344
dc.subjectQuantum Physics
dc.titleExperimental Measurement of Multi-dimensional Entanglement via Equivalent Symmetric Projection
dc.typetext

Files

Collections

arXiv