Detection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy

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dc.creatorStomp, Romain
dc.creatorMiyahara, Yoichi
dc.creatorSchaer, Sacha
dc.creatorSun, Qingfeng
dc.creatorGuo, Hong
dc.creatorGrutter, Peter
dc.creatorStudenikin, Sergei
dc.creatorPoole, Philip
dc.creatorSachrajda, Andy
dc.date2005-01-11
dc.date.accessioned2026-07-07T03:03:11Z
dc.date.available2026-07-07T03:03:11Z
dc.descriptionSingle electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage and the resulting spectra show distinct jumps when the tip was positioned above the dot. The observed jumps in the frequency shift, with corresponding peaks in dissipation, are attributed to a single electron tunneling between the dot and the back electrode governed by Coulomb blockade effect, and are consistent with a model based on the free energy of the system. The observed phenomenon may be regarded as the ``force version'' of the Coulomb blockade effect.
dc.description4 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0501272
dc.identifierhttp://arxiv.org/abs/cond-mat/0501272
dc.identifierPhys. Rev. Lett. 94, 056802 (2005)
dc.identifierdoi:10.1103/PhysRevLett.94.056802
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/25659
dc.subjectMaterials Science
dc.titleDetection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy
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