Irreversibility line and low-field grain-boundary pinning in electron-doped superconducting thin films

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dc.creatorSergeenkov, S.
dc.creatorLanfredi, A. J. C.
dc.creatorAraujo-Moreira, F. M.
dc.date2007-01-19
dc.date.accessioned2026-07-07T07:41:53Z
dc.date.available2026-07-07T07:41:53Z
dc.descriptionAC magnetic susceptibilities of electron-doped Pr_{1.85}Ce_{0.15}CuO_4 (PCCO) and Sm_{1.85}Ce_{0.15}CuO_4 (SCCO) granular thin films have been measured as a function of temperature and magnetic-field strength. Depending on the level of homogeneity of our films, two different types of the irreversibility line (IL) defined as the intergrain-loss peak temperature in the imaginary part of susceptibility have been found. The obtained results are described via the critical-state model taking into account the low-field grain-boundary pinning. The extracted pinning-force densities in more granular SCCO films turn out to be four times larger than their counterparts in less granular PCCO films.
dc.identifierhttps://arxiv.org/abs/cond-mat/0701474
dc.identifierhttp://arxiv.org/abs/cond-mat/0701474
dc.identifierJ. Appl. Phys. 100, 123903 (2006)
dc.identifierdoi:10.1063/1.2402969
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/122279
dc.subjectSuperconductivity
dc.subjectMaterials Science
dc.titleIrreversibility line and low-field grain-boundary pinning in electron-doped superconducting thin films
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