Dynamic Force Spectroscopy: Looking at the Total Harmonic Distortion

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dc.creatorStark, Robert W.
dc.date2005-01-12
dc.date.accessioned2026-07-07T05:53:56Z
dc.date.available2026-07-07T05:53:56Z
dc.descriptionTapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a correct interpretation data acquired by dynamic AFM. Here, the system response in tapping-mode atomic force microscope (AFM) simulated numerically. In the computer model the AFM microcantilever is treated as a distributed parameter system. With this multiple-degree-of-freedom (MDOF) approach the the total harmonic distortion in dynamic AFM spectroscopy is simulated.
dc.description5 pages, 3 figures First International Meeting on Applied Physics (aphys2003), 2003, Badajoz, Spain
dc.identifierhttps://arxiv.org/abs/physics/0501061
dc.identifierhttp://arxiv.org/abs/physics/0501061
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/86807
dc.subjectInstrumentation and Detectors
dc.titleDynamic Force Spectroscopy: Looking at the Total Harmonic Distortion
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