Temperature Dependence of Piezoelectric and Electrostrictive Properties in a PBN:65 Morphotropic Phase Boundary Thin Film

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dc.creatorYang, Xi
dc.creatorBeckwith, A. W.
dc.date2005-01-07
dc.date.accessioned2026-07-07T03:03:05Z
dc.date.available2026-07-07T03:03:05Z
dc.descriptionWe used an optical reflection method to measure the temperature-dependence of the piezoelectricity, electrostriction and time constant of a morphotropic phase boundary (MPB) thin film. We obtained the piezoelectric constant and the electrostrictive constant as a function of temperature by curve fitting the experimental data. We also obtained the time constant as a function of temperature and applied voltage. An abnormal behavior of the strain that was larger at 275 K than at 285 K was observed. This observation was also consistent with the minimal hysteresis behavior of the time constant at 275 K. We provided a possible explanation for this observation.
dc.description16 pages, 5 figures, has been submitted to physics journal for referee vetting
dc.identifierhttps://arxiv.org/abs/cond-mat/0501131
dc.identifierhttp://arxiv.org/abs/cond-mat/0501131
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/25628
dc.subjectMaterials Science
dc.titleTemperature Dependence of Piezoelectric and Electrostrictive Properties in a PBN:65 Morphotropic Phase Boundary Thin Film
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