Folding a 2-D powder diffraction image into a 1-D scan: a new procedure

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dc.creatorCervellino, Antonio
dc.creatorGiannini, Cinzia
dc.creatorGuagliardi, Antonietta
dc.creatorLadisa, Massimo
dc.date2006-01-25
dc.date.accessioned2026-07-07T12:08:20Z
dc.date.available2026-07-07T12:08:20Z
dc.descriptionA new procedure aiming at folding a powder diffraction 2-D into a 1-D scan is presented. The technique consists of three steps: tracking the beam centre by means of a Simulated Annealing (SA) of the diffraction rings along the same axis, detector tilt and rotation determination by a Hankel Lanczos Singular Value Decomposition (HLSVD) and intensity integration by an adaptive binning algorithm. The X-ray powder diffraction (XRPD) intensity profile of the standard NIST Si 640c sample is used to test the performances. Results show the robustness of the method and its capability of efficiently tagging the pixels in a 2-D readout system by matching the ideal geometry of the detector to the real beam-sample-detector frame. The whole technique turns out in a versatile and user-friendly tool for the $2\vartheta$ scanning of 2-D XRPD profiles.
dc.description11 pages, 1 table, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0601576
dc.identifierhttp://arxiv.org/abs/cond-mat/0601576
dc.identifierJ. Appl. Cryst. (2006). 39, 745-748
dc.identifierdoi:10.1107/S0021889806026690
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/209286
dc.subjectMaterials Science
dc.titleFolding a 2-D powder diffraction image into a 1-D scan: a new procedure
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