Lifetime statistics in chaotic dielectric microresonators

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dc.creatorSchomerus, Henning
dc.creatorWiersig, Jan
dc.creatorMain, Jörg
dc.date2008-12-15
dc.date.accessioned2026-07-07T13:13:53Z
dc.date.available2026-07-07T13:13:53Z
dc.descriptionWe discuss the statistical properties of lifetimes of electromagnetic eigenmodes in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of anomalously short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance trapping phenomenon.
dc.description7 pages, 5 figures
dc.identifierhttps://arxiv.org/abs/0812.2823
dc.identifierhttp://arxiv.org/abs/0812.2823
dc.identifierPhys. Rev. A 79, 053806 (2009)
dc.identifierdoi:10.1103/PhysRevA.79.053806
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/230040
dc.subjectOptics
dc.titleLifetime statistics in chaotic dielectric microresonators
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