Interface-anisotropy induced asymmetry of intermixing in bilayers
| dc.creator | Süle, P. | |
| dc.creator | Menyhárd, M. | |
| dc.creator | Kótis, L. | |
| dc.creator | Lábár, J. | |
| dc.creator | Egelhoff Jr, W. F. | |
| dc.date | 2005-10-04 | |
| dc.date.accessioned | 2026-07-07T06:20:46Z | |
| dc.date.available | 2026-07-07T06:20:46Z | |
| dc.description | The ion-sputtering induced intermixing is studied by molecular dynamics (MD) simulations and by Auger electron spectroscopy depth profiling (AES-DP) analysis in Pt/Ti/Si substrate (Pt/Ti) and Ta/Ti/Pt/Si substrate (Ti/Pt) multilayers. Experimental evidence is found for the asymmetry of intermixing in Pt/Ti and in Ti/Pt. An unexpected enhancement of the injection of the heavy Pt atoms into the Ti substrate is observed both by AES-DP and by MD simulations. In Ti/Pt we get a much weaker interdiffusion than in Pt/Ti. The asymmetry is explained by the backscattering of hyperthermal particles at the mass-anisotropic interface and which is reproduced by computer atomistic simulations. The AES-DP measurements support our earlier predictions (P. Süle, M. Menyhárd, Phys. Rev., {\bf B71}, 113413 (2005)) obtained for mass-anisotropic bilayers. | |
| dc.description | 4 pages, 4 figures, sule@mfa.kfki.hu | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0510077 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0510077 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/95405 | |
| dc.subject | Materials Science | |
| dc.title | Interface-anisotropy induced asymmetry of intermixing in bilayers | |
| dc.type | text |