A set-up for measurement of low frequency conductance fluctuation (noise) using digital signal processing techniques

dc.creatorGhosh, Arindam
dc.creatorKar, Swastik
dc.creatorBid, Aveek
dc.creatorRaychaudhuri, A. K.
dc.date2004-02-04
dc.date.accessioned2026-07-07T02:56:18Z
dc.date.available2026-07-07T02:56:18Z
dc.descriptionWe describe a set up for measurements of low frequency (1 mHz < f < 20 Hz) conductance fluctuations in a solid conductor. The set-up uses a five probe a.c. measurement technique and extensive digital signal processing to reach a noise floor down to $S_{v}(f) \leq 10^{-20}$ V$^{2}$Hz$^{-1}$. The set up also allows measurement of noise using an a.c. in presence of a superimposed direct current. This feature is desirable in studies of electromigration damage or in systems that show non-linear conductivity. In addition, we describe a scheme which allows us to obtain the probability density function of the conductance fluctuation after subtracting the extraneous noise contributions (background) from the observed noise. The set-up has been used for conductance fluctuation measurement in the temperature range 1.5 K < T < 500 K in the presence of magnetic fields. We present some representative data obtained by this system.
dc.description25 pages 17 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0402130
dc.identifierhttp://arxiv.org/abs/cond-mat/0402130
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/23267
dc.subjectOther Condensed Matter
dc.titleA set-up for measurement of low frequency conductance fluctuation (noise) using digital signal processing techniques
dc.typetext

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