Depth evolution of YBa2Cu3O7-d ultrathin films probed by X-ray photoemission spectroscopy

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dc.creatorSeo, H. W.
dc.creatorChen, Q. Y.
dc.creatorvan der Heide, Paul
dc.creatorChu, Wei-Kan
dc.date2006-03-28
dc.date.accessioned2026-07-07T07:05:02Z
dc.date.available2026-07-07T07:05:02Z
dc.descriptionX-ray photoemission spectroscopy has been used to investigate the depth dependent crystal structures and chemical compositions of sequentially chemical-etched YBa2Cu3O7-d (YBCO) ultrathin film superconductors. In the near-interface region the crystal structure is severely oxygen deficient and of tetragonal symmetry. We consider this a revelation of retarded oxygen diffusion into the O(1) sites during the post-deposition annealing in the presence of interface mismatch strain. Near the free surface, the oxygen-deficiency was much alleviated because of the partial strain relaxation and the crystal symmetry becomes orthorhombic. Compared with as-deposited films of equivalent thickness, which is less oxygen deficient and shows superconducting transition, the stripped-down near-interface layer exhibits no sign of superconductivity.
dc.identifierhttps://arxiv.org/abs/cond-mat/0603767
dc.identifierhttp://arxiv.org/abs/cond-mat/0603767
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/109541
dc.subjectMaterials Science
dc.subjectSuperconductivity
dc.titleDepth evolution of YBa2Cu3O7-d ultrathin films probed by X-ray photoemission spectroscopy
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