Shot noise in long conductors
| dc.creator | Naveh, Y. | |
| dc.date | 1998-06-29 | |
| dc.date.accessioned | 2026-07-07T03:10:56Z | |
| dc.date.available | 2026-07-07T03:10:56Z | |
| dc.description | Using the 'drift-diffusion-Langevin' equation we show that, at least in one geometry, finite-frequency shot noise is of the order of the 'full' shot noise $2eI$ provided the sample is either short or long enough, $L > L_0(ω)$. Here $L_0(ω) = D'/\lph ω$ with $D'$ the effective diffusion coefficient, $\lph$ the electron-phonon energy relaxation length with energy transfer $eV$, and $ω$ the observation frequency. For example, in a typical 'zero frequency' experiment, actually performed at 10 KHz, shot noise may be large for $L$ larger than a few centimeters. At 100 MHz shot noise may be large for any length of the sample. The physical reason for this result -- a competition between the equilibration length and the dynamic screening length -- is discussed in the text. | |
| dc.description | 3 pages, 2 figures. Fig. 1 is color-coded - hard copies also available from author. Note change in e-mail address | |
| dc.identifier | https://arxiv.org/abs/cond-mat/9806348 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/9806348 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/28393 | |
| dc.subject | Mesoscale and Nanoscale Physics | |
| dc.subject | Strongly Correlated Electrons | |
| dc.title | Shot noise in long conductors | |
| dc.type | text |