The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

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dc.creatorSuszynski, Z.
dc.creatorKosikowski, M.
dc.creatorDuer, R.
dc.date2007-09-12
dc.date.accessioned2026-07-07T08:29:08Z
dc.date.available2026-07-07T08:29:08Z
dc.descriptionIn this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the one evaluated basing upon experimenatal data.
dc.descriptionSubmitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)
dc.identifierhttps://arxiv.org/abs/0709.1866
dc.identifierhttp://arxiv.org/abs/0709.1866
dc.identifierDans Proceedings of 12th International Workshop on Thermal investigations of ICs - THERMINIC 2006, Nice : France (2006)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/137860
dc.subjectMaterials Science
dc.titleThe application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure
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